sNp file for a portion of a fixture, such as those found in transitions, based on phase function matching. Signal integrity engineers can generate a.
To aid in analyzing isolated defects within the test fixture, aSequential Peeling feature is included in UFX, as well. The UFX option provides advanced de-embedding tools, allowing engineers to incrementally add calibration standards and characteristic data as they become available, for improved fixture extraction accuracy. Since this is atypical, using previous techniques result in substantial de-embedding errors. In environments where a complete set of calibration standards are not available, the traditional method is to assume that both paths of the fixture are perfectly symmetrical and with perfect match. It also provides engineers with the ability to develop high-speed data throughput products with competitive advantages.įully corrected test fixture calibration techniques require a complete set of calibration standards at both ends of the fixture transmission path. The VNA solution speeds time to market by enhancing model accuracy through improved test fixture de-embedding thereby improving first time yields.
VectorStar VNAs configured with UFX provide signal integrity and on-wafer engineers with multiple benefits. Developed to address the design challenges associated with the high-frequency, high data rate requirements of 4G and emerging 5G systems, as well as backhaul and data centers, UFX features unique analysis toolsso engineers can more accurately and efficiently evaluate designs. Morgan Hill, CA – – Anritsu Company introduces the Universal Fixture Extraction (UFX)option for its VectorStar® vector network analyzers ( VNAs) to provide signal integrity and on-wafer engineers with an increased range of on-wafer and fixture calibration choices, even when a full set of calibration standards is not available.
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